Test and Design-for-Testability in Mixed-Signal Integrated Circuits J. Koerting Las Palmas (1993)

Las Palmas (1993)

Auch bei den Importen verzeichnete man Rückgänge

bedarf es des Zusammenwirkens vieler Stellen innerhalb und zunehmend auch außerhalb der Unternehmung

though the participants conceded that in many instances technology was more the symbol than the substance of the problem

Test and Design-for-Testability in Mixed-Signal Integrated Circuits J. Koerting Las Palmas (1993)Test and Design for Testability in Mixed Signal Integrated Circuits deals with test and design for test of analog and mixed signal integrated circuits. Especially in System on Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and